Synthesis and characterization of CrB2 thin films grown by DC magnetron sputtering

نویسندگان

چکیده

CrBx thin films with 1.90 ? x 2.08 have been deposited by direct-current magnetron sputtering (DCMS) from a stoichiometric CrB2 target at 5 and 20 mTorr (0.67 2.67 Pa) Ar pressure onto sapphire (0001) substrates. All films, irrespective of deposition conditions, exhibit texture. Attesting to the achievement close-to-stoichiometric composition, epitaxial film growth is observed 900°C, while 500 °C yields fiber Film composition does not depend on substrate temperature but exhibits slightly reduced B content increasing for samples 900°C. Excess in overstoichiometric CrB2.08 segregates form B-rich inclusions. Understoichiometry CrB1.90 accommodated Cr-rich stacking faults {11¯00} prismatic planes.

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ژورنال

عنوان ژورنال: Scripta Materialia

سال: 2021

ISSN: ['1359-6462', '1872-8456']

DOI: https://doi.org/10.1016/j.scriptamat.2021.113915